Search results for "Noise spectral density"

showing 10 items of 24 documents

Capacity Analysis in Downlink WCDMA Systems Using Soft Handover Techniques With SIR-Based Power Control and Site Selection Diversity Transmission

2006

This work analyzes the downlink performance of a WCDMA system with site selection diversity transmission power control (SSDT) during soft handover mode. Signal to interference ratio (SIR) power control techniques are modeled and used in the simulations of this analysis. The study is focused on finding the optimum soft handover margin in terms of maximum system capacity under energy-per-bit to noise spectral density ratio (Eb/N0) quality requirements. The results of this analysis show an increase in user capacity of about 15 -20 % for optimum soft handover margins of 5 – 5.5 dB. Nevertheless, the resources required (number of scrambling codes) by base station increase faster than the number …

EngineeringSignal-to-interference ratioCode division multiaccessComputer Networks and Communicationsbusiness.industryNoise spectral densityAerospace EngineeringSoft handoverPower controlChannel capacityBase stationHandoverTEORIA DE LA SEÑAL Y COMUNICACIONESAutomotive EngineeringTelecommunications linkHandover techniquesElectronic engineeringSoft handover marginElectrical and Electronic EngineeringbusinessPower controlIEEE Transactions on Vehicular Technology
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Photothermal excitation setup for a modified commercial atomic force microscope

2014

High-resolution imaging in liquids using frequency modulation atomic force microscopy is known to suffer from additional peaks in the resonance spectrum that are unrelated to the cantilever resonance. These unwanted peaks are caused by acoustic modes of the liquid and the setup arising from the indirect oscillation excitation by a piezoelectric transducer. Photothermal excitation has been identified as a suitable method for exciting the cantilever in a direct manner. Here, we present a simple design for implementing photothermal excitation in a modified Multimode scan head from Bruker. Our approach is based on adding a few components only to keep the modifications as simple as possible and …

Materials scienceCantileverPhotothermal spectroscopyOscillationbusiness.industryNoise spectral densityPhotothermal therapy530OpticsTransducerbusinessInstrumentationFrequency modulationExcitation
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Typical Aspects of the Microwave Noise Performance of HEMTs at Decreasing Temperatures

1996

In analog signal processing at microwave frequencies the noise performance of active devices is of fundamental importance for the accurate design of low-noise amplifiers. To this aim, the determination of the four noise parameters F O , Γ O (complex variable) and Rn has to be accomplished together with the usual scattering parameter measurements vs. frequency. In addition, the dependence of the device performance vs. temperature is of interest for circuit applications characterized by harsh environmental conditions. In this work the noise behavior of high electron mobility transistors has been investigated by means of measurements and modeling in the 2-18 GHz frequency range and as a functi…

Noise temperatureMaterials sciencemicrowavebusiness.industryNoise spectral densitynoise parametersGeneral Physics and Astronomy020206 networking & telecommunicationsY-factor02 engineering and technologyHigh-electron-mobility transistorHEMT; microwave; noise parameters; low temperaturelow temperatureNoise figureNoise (electronics)[PHYS.HIST]Physics [physics]/Physics archives0202 electrical engineering electronic engineering information engineeringOptoelectronicsEquivalent circuitbusinessMicrowaveHEMT
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Computer-Aided Simultaneous Determination of Noise and Gain Parameters of Microwave Transistors

1979

A new method for the determination of noise and gain parameters of microwave linear two-ports (transistors) is presented. The method allows the simultaneous determination of the two parameter sets through a proper computer-aided procedure which processes the experimental data obtained from a measuring system employing noise meters and generators only. Experimental verifications carried-out on a microwave low noise transistor in S-band are reported.

PhysicsNoise temperatureNoise measurementNoise generatorNoise spectral densityHardware_INTEGRATEDCIRCUITSElectronic engineeringY-factorFlicker noiseNoise figureNoise floor9th European Microwave Conference, 1979
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Complete characterization of low-noise devices at microwave frequencies: two alternative procedures for HEMTs

1995

Noise temperatureMaterials scienceNoise generatorNoise measurementNoise spectral densityElectronic engineeringFlicker noiseY-factorNoise figureNoise (radio)46th ARFTG Conference Digest
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Cross-Spectrum PM Noise Measurement, Thermal Energy, and Metamaterial Filters.

2017

International audience; Virtually all commercial instruments for the measurement of the oscillator PM noise make use of the crossspectrum method (arXiv:1004.5539 [physics.ins-det], 2010). High sensitivity is achieved by correlation and averaging on two equal channels, which measure the same input, and reject the background of the instrument.We show that a systematic error is always present if the thermal energy of the input power splitter is not accounted for. Such error can result in noise underestimation up to a few decibels in the lowest-noise quartz oscillators, and in an invalid measurement in the case of cryogenic oscillators. As another alarming fact, the presence of metamaterial com…

Physics[SPI.OTHER]Engineering Sciences [physics]/OtherAcoustics and UltrasonicsOscillator phase noiseNoise measurementbusiness.industryNoise spectral densityNoise figure01 natural sciencesNoise (electronics)Noise floor010309 opticsOptics0103 physical sciencesPhase noiseEffective input noise temperatureElectrical and Electronic Engineeringbusiness010301 acousticsInstrumentationIEEE transactions on ultrasonics, ferroelectrics, and frequency control
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Signal to Noise Ratio of Silicon Photomultipliers measured in the Continuous Wave Regime

2014

We performed a Signal to Noise Ratio characterization, in the continuous wave regime, at different bias voltages, frequencies and temperatures, on a novel class of silicon photomultipliers fabricated in planar technology on silicon p-type substrate. Signal to Noise Ratio has been measured as the ratio of the photogenerated current, filtered and averaged by a lock-in amplifier, and the Root Mean Square deviation of the overall current flowing to the device. The measured noise takes into account the shot noise, resulting from the photocurrent and the dark current. We have also performed a comparison between our SiPMs and a photomultiplier tube in terms of Signal to Noise Ratio, as a function …

Noise temperatureMaterials sciencePhysics::Instrumentation and Detectorsbusiness.industryphotomultipliers sipm snr detector siliconNoise spectral densityElectrical engineeringShot noiseSettore ING-INF/02 - Campi ElettromagneticiNoise figureNoise (electronics)Settore ING-INF/01 - ElettronicaSignal-to-noise ratioOpticsNoise generatorFlicker noisebusiness
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Effect of the non-gaussianity on the measurement error for the filtered 1/f noise intensity

1999

To study the nature of the 1/f noise phenomenon in conductors, we seek a tool for testing different hypotheses of 1/f noise origin. The method analyzing the noise intensity at the output of a bandpass filter is discussed for the case of non-Gaussian processes. Data on measurement error are presented for the 1/f noise intensity in GaAs films and the Gaussian white noise emulated by a computer. A numerical model of 1/f noise as the superposition of telegraph random processes has been created. This method requires further improvement to check the noise for stationarity. Some ideas of how to do that are proposed.

PhysicsNuclear and High Energy PhysicsNoise measurementNoise spectral densityAstronomy and AstrophysicsStatistical and Nonlinear PhysicsNoise (electronics)Electronic Optical and Magnetic MaterialsGradient noiseBurst noisesymbols.namesakeNoise generatorGaussian noisesymbolsValue noiseStatistical physicsElectrical and Electronic EngineeringRadiophysics and Quantum Electronics
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Modification of a commercial atomic force microscopy for low-noise, high-resolution frequency-modulation imaging in liquid environment.

2011

A key issue for high-resolution frequency-modulation atomic force microscopy imaging in liquids is minimizing the frequency noise, which requires a detailed analysis of the corresponding noise contributions. In this paper, we present a detailed description for modifying a commercial atomic force microscope (Bruker MultiMode V with Nanoscope V controller), aiming at atomic-resolution frequency-modulation imaging in ambient and in liquid environment. Care was taken to maintain the AFMs original stability and ease of operation. The new system builds upon an optimized light source, a new photodiode and an entirely new amplifier. Moreover, we introduce a home-built liquid cell and sample holder …

noiseMaterials scienceoptical sensorsAtomic force acoustic microscopy530Noise (electronics)law.inventionOpticsphotodiodeslawInstrumentationAtomic de Broglie microscopeatomic force microscopycalcium compoundsbusiness.industrysample holdersAmplifierNoise spectral densityPhotodiodefrequency modulationmodulationfrequencyamplifiersbusinessNon-contact atomic force microscopyFrequency modulationimage resolutionThe Review of scientific instruments
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Stochastic resonance in a tunnel diode in the presence of white or coloured noise

1995

We study the signal-to-noise ratio, signal and noise output levels in a fast bistable electronic system: a tunnel diode. We observe stochastic resonance when the system is driven by a sum of a small periodic signal and noise. The phenomenon is investigated for values of the driving frequency as high as 10 kHz. This is the highest frequency value used in SR experiments until now. In the presence of «white noise», we observe a nonmonotonic behavior characterized by a sharp dip in the output noise level measured at 100Hz and 1 kHz. A similar behavior is predicated by recent theories. We also present preliminary experimental results of SR in the presence of an Ornstein-Uhlenbeck noise. For the …

PhysicsNoise temperatureBurst noiseOpticsNoise generatorbusiness.industryStochastic resonanceNoise spectral densityGeneral Physics and AstronomyBrownian noiseFlicker noisebusinessNoise (radio)Il Nuovo Cimento D
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